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Title: Effect of process cooling history on the interphase structure/properties relationship in carbon fibre/peek composites
Authors: Gao, Shang-Lin
Kim, Jang-Kyo
Keywords: Process cooling history
Interphase structure/properties
Carbon fibre-polyetheretherketone (PEEK)
Interface shear strength (IFSS)
Scanning force microscopy (SFM)
Transmission electron microscopy (TEM)
Interlaminar shear strength (ILSS)
Issue Date: 1999
Citation: Preprints of Second East Asian Polymer Conference, Hong Kong, 12-16 Jan. 1999, Hong Kong University of Science and Technology, Hong Kong, 1999, p. 331-332
Abstract: It is well known that the mechanical properties of semicrystalline thermoplastic composites are strongly influenced by the processing history through its effect on fibre-matrix interphase properties. The rich variety of phenomena intrinsic to composite interphase have warranted a great deal of experimental and theoretical investigations. From a practical viewpoint, control of processing conditions and thus the failure at the semicrystalline interphase is one of the most efficient approaches for optimizing the mechanical performance of thermoplastic composites. The objective of this paper is to investigate the effect of process cooling history under isothermal and non-isothermal conditions on micro- and macro-mechanical properties of carbon fibre-polyetheretherketone (PEEK) composites. The interface shear strength (IFSS) is characterized using both single-fibre fragmentation and pull-out tests. The variation of interphase stiffness and microstructure are evaluated based on the nanoindentation technology, scanning force microscopy (SFM) and transmission electron microscopy (TEM). The crystallinity of matrix is determined using differential scanning calorimetry (DSC). The bulk composite mechanical properties, including the strength and modulus in tension and bending and interlaminar shear strength (ILSS), are measured for unidirectional laminates. The failure mechanisms are identified from the analyses of stress birefringence patterns and scanning electron microphotographs.
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