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Please use this identifier to cite or link to this item: http://hdl.handle.net/1783.1/1631
Title: Surface morphology study of immiscible PS/PVP blend compatibilized with random copolymer by Tof-SIMS chemical imaging
Authors: Zeng, X. M.
Weng, Lu-Tao
Li, L.
Chan, Chi-Ming
Keywords: Random copolymer
Immiscible PS/PVP blend
ToF-SIMS chemical imaging
Issue Date: 1999
Citation: Preprints of Second East Asian Polymer Conference, Hong Kong, 12-16 Jan 1999, Hong Kong University of Science and Technology, Hong Kong, 1999, p. 52-53
Abstract: Blending of immiscible polymers could be an effective method to obtain the required properties of the final products. However, simple mixing two or more polymers would result in poor adhesion, thus initiating cracks. By addition of an interfacial agent, the interfacial adhesion of the immiscible polymer blend can be improved and uniform particle size can be achieved. In practice, random copolymers can be good compatibilizers, and moreover, are relatively easy to synthesize and at low costs. Recently, Dai and et al. investigated the immiscible homopolymer's polystyrene (PS) and poly(2-vinylpyridine) (PVP) reinforced with random copolymer, dPSf-r-PVP1-f. They found that long, random copolymers were remarkably effective in reinforcing immiscible polymer interfaces. The strengthening effect on the interface of random copolymer between polystyrene (PS) and poly(methyl methacrylate) (PMMA) were also investigated by Kulasekere et al. The purpose of this study is to reveal the compatibilizing performance of a random copolymer poly(styrene-co-4-vinylphenol), with two vinyl phenol contents (9mol% and 22mol%) (STVPh-9 and STVPh-22), on immiscible PS and PVP blends by using ToF-SIMS chemical imaging. The effect of vinyl phenol content of STVPh on the phase behavior is also studied by using ToF-SIMS technique.
URI: http://hdl.handle.net/1783.1/1631
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CBME Conference Papers

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