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HKUST Institutional Repository >
Materials Characterization and Preparation Facility  >

MCPF Conference Papers
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Characterization of nanostructures micromachined with focused ion beams (FIB)

Study on the compatibilization of polycarbonate(PC) and poly(vinylidene fluoride)(PVDF) using ToF SIMS

Structure-property relationships of series copolymers with well-defined sequence lengths

Surface morphology study of immiscible PS/PVP blend compatibilized with random copolymer by Tof-SIMS chemical imaging
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