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Please use this identifier to cite or link to this item: http://hdl.handle.net/1783.1/1940
Title: Interference issues in silicon RFIC design
Authors: Zhang, Shaofeng
Pun, Alan Leung Ling
Lau, Jack
Keywords: CMOS integrated circuits
Crosstalk
Electromagnetic interference
Electromagnetic shielding
Integrated circuit noise
Issue Date: 1998
Citation: 1998 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers. IEEE, 1998, p. 119-22
Abstract: Traditional noise immunity methodologies used in PCB designs are less effective when applied to RFICs. We present here analyses of both electromagnetic interferences and spiral inductor induced substrate noise in silicon RFICs that can be an impediment in achieving higher integration. In the analysis, we (1) compare the effectiveness of 4 shielding solutions in a triple layer metal technology, (2) contrast the interference on both heavily doped and lightly doped substrates, (3) study the impact of physical separation and geometrical variations, (4) and measure the inductor induced substrate noise on a 0.8 um triple-layer CMOS process.
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URI: http://hdl.handle.net/1783.1/1940
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