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http://hdl.handle.net/1783.1/3330
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| Title: | Microstructure, magnetic, and spin-dependent transport properties of (Zn,Cr)Te films fabricated by magnetron sputtering |
| Authors: | Wang, W. G.
Yee, K. J.
Kim, D. H.
Han, K. J.
Wang, Xiang-Rong
Ni, C.
Moriyama, T.
Mathew, A.
Opila, R.
Zhu, T.
Xiao, John Q. |
| Keywords: | Chromium compounds
Doping profiles
Ferromagnetic materials
Hall effect
II-VI semiconductors
Impurities
Magnetic circular dichroism
Magnetic semiconductors |
| Issue Date: | Apr-2008 |
| Citation: | Physical review. B, v. 77, 155207 |
| Abstract: | Chromium doped zinc telluride thin films with various doping concentrations are fabricated by magnetron sputtering. These films are ferromagnetic and the Curie temperature increases with Cr concentration. X-ray diffraction, transmission electron microscopy, and magnetic circular dichroism characterizations show that the films are free of Cr1-xTex impurities and the ferromagnetism is intrinsic. The transport study shows that the resistivity and magnetoresistance are governed by variable range hopping at low temperatures. A negative magnetoresistance as large as −57% is observed at 5 K. The magnetoresistance and its temperature dependence can be well explained by a model involving an increase in the localization length of carriers with a magnetic field in the hopping region. An anomalous Hall effect is also observed and a possible origin of the sign difference between the anomalous Hall resistance and ordinary Hall resistance is discussed. |
| Rights: | Physical Review B © copyright (2008) American Physical Society. The Journal's web site is located at http://prb.aps.org/ |
| URI: | http://hdl.handle.net/1783.1/3330 |
| Appears in Collections: | PHYS Journal/Magazine Articles
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