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Please use this identifier to cite or link to this item: http://hdl.handle.net/1783.1/412
Title: Laser interferometer system for straightness measurements
Authors: Cai, Li-Long
Zhang, Jihua
Keywords: Laser interferometer system
Short range measurements
Long range measurements
Issue Date: 26-May-1998
Citation: US Patent 5,757,491. Washington, DC: US Patent and Trademark Office, 1998.
Abstract: A laser interferometer system in particular for measuring the straightness of an object is described. This interferometer employs triangular prisms to refract the laser beams by certain angles with respect to the principal axis of the incident beam. Two configurations are described. One is for high accuracy in short range measurements, the other can handle long range measurements with high resolution that is not related to the range. For the latter the interferometer comprises a laser source, a beam splitter, a plane reflector, two first triangular prisms, a second prism, a right angle prism reflector and a detector system. The second prism and the right-angle prism reflector are integrated into one body to form a movable component and are attached to the object to be measured.
Rights: This patent is also available at HKUST Technology Transfer Center Patent Search at <http://patentsearch.ttc.ust.hk/ListPatentsDetail.asp?id=81>
URI: http://hdl.handle.net/1783.1/412
Appears in Collections:MECH Patents

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