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Title: Chip error pattern analysis in IEEE 802.15.4
Authors: Wu, Kaishun
Tan, Haoyu
Ngan, Hoi Lun
Ni, Lionel M.
Keywords: IEEE 802.15.4
Physical layer (PHY)
Pseudonoise (PN) codes
Chip error patterns
Measurement study
Issue Date: Mar-2010
Citation: Proceedings IEEE INFOCOM 2010, 14-19 March 2010, San Diego, CA, USA, p. 1-5
Abstract: IEEE 802.15.4 standard specifies physical layer (PHY) and medium access control (MAC) sublayer protocols for low-rate and low-power communication applications. In this protocol, every 4-bit symbol is encoded into a sequence of 32 chips that are actually transmitted over the air. The 32 chips as a whole is also called a pseudo-noise code (PN-Code). Due to complex channel conditions such as attenuation and interference, the transmitted PN-Code will often be received with some PN-Code chips corrupted. In this paper, we conduct a systematic analysis on these errors occurring at chip-level. We find that there are notable error patterns corresponding to different cases. Recognizing these patterns will enable us to identify the channel condition in great details. We believe that understanding what happened to the transmission in our setup can potentially bring benefit to channel coding, routing and error correction protocol design.
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