HKUST Library Institutional Repository Banner

HKUST Institutional Repository >
Mechanical Engineering >
MECH Conference Papers >

Please use this identifier to cite or link to this item: http://hdl.handle.net/1783.1/6787
Title: Multiscale approach optimization on surface wettability change on rough surface
Authors: Yuen, Matthew Ming-Fai
Fan, Haibo
Chan, Edward King-Long
Keywords: Multiscale approach optimization
Rough surface
Surface wettability
Issue Date: Apr-2010
Citation: International Conference on Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), Bordeaux, France, 26-28 April 2010
Abstract: Surface wettability is known that is not only governed by chemical structure but also by the surface geometrical structure. A multiscale approach on rough surface wettability study was presented in this paper. The wettability study of photo-switched trans and cis isomers of azobenzene on different substrates was first calculated by molecular dynamics calculations. Different chemical structures and configurations were input into the molecular model to get equilibrated structures. Contact angle is then estimated and input into finite element model with roughness factor included. The parameters were input into the FLUENT software to estimate the respective surface wettability for each individual trans and cis configuration on different rough surface. The simulated wettability results were found to be in good correlation with experimental measures. This multiscale approach provides an opportunity to study the combined effects of surface interaction at molecular scale, and micron scale surface roughness, on the wettability of a rough surface. It enables the prediction of contact angle of liquid media on rough surfaces which will be a powerful tool in the selection and optimization of material and substrate surface structure to control the hydrophobicity/hydrophilicity at liquid/solid interface.
Rights: © 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
URI: http://hdl.handle.net/1783.1/6787
Appears in Collections:MECH Conference Papers

Files in This Item:

File Description SizeFormat
05464552.pdf9844KbAdobe PDFView/Open

All items in this Repository are protected by copyright, with all rights reserved.