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Kwok, Hoi Sing (郭海成)

  • Director, Center for Display Research (CDR), Dept of Electronic & Computer Engineering
  • Director, State Key Laboratory on Advanced Displays and Optoelectronics Technologies (ADT), Dept of Electronic & Computer Engineering
  • Dr William M W Mong Chair Professor of Nanotechnology, Dept of Electronic & Computer Engineering
  • Chair Professor, Dept of Electronic & Computer Engineering

Telephone: 2358 7056    Email: eekwok@ust.hk   
Homepage: http://www.ee.ust.hk/~eekwok/
Scopus: 36071953500    Google Scholar: t3mcfk0AAAAJ    ORCID: 0000-0002-2820-9530   
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Summary

  Total Conference paper Article Patent Book chapter Book
All publications 1251 595 572 75 5 4
HKUST affiliated 1112 548 482 75 3 4

Publication List

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Article

Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin-film transistors under AC gate bias stress
Author(s): 张猛 HKUST affiliated (currently or previously) ; 夏之荷 HKUST affiliated (currently or previously) ; 周玮 View this author's profile ; 陈荣盛 HKUST affiliated (currently or previously) ; 王文 View this author's profile ; 郭海成 View this author's profile
Source: 液晶与显示, v. 32, (2), Feb 2017, p. 91-96, Chinese Journal of Liquid Crystals and Displays
Article, 2017