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Zhou, Wei (周瑋)

  • Research Assistant Professor, Dept of Electronic & Computer Engineering

Telephone: 3469 2275    Email: eepeggy@ust.hk   
Homepage: http://ihome.ust.hk/~eepeggy/
Scopus: 56495893600    Google Scholar: ZNHN4IEAAAAJ    ORCID iD: https://orcid.org/0000-0002-9533-6767   
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  Total Article Conference paper Book chapter Patent
All publications 63 32 29 1 1
HKUST affiliated 43 26 15 1 1

Publication List

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Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin-film transistors under AC gate bias stress
Author(s): 张猛 HKUST affiliated (currently or previously) ; 夏之荷 HKUST affiliated (currently or previously) ; 周玮 View this author's profile ; 陈荣盛 HKUST affiliated (currently or previously) ; 王文 View this author's profile ; 郭海成 View this author's profile
Source: 液晶与显示, v. 32, (2), Feb 2017, p. 91-96, Chinese Journal of Liquid Crystals and Displays
Article, 2017

Degradation Behavior and Degradation Mechanism of Bridged-Grain Polycrystalline Silicon Thin Film Transistor under DC Bias Stress
Author(s): Zhang, Meng HKUST affiliated (currently or previously) ; Xia, Zhihe HKUST affiliated (currently or previously) ; Zhou, Wei View this author's profile ; Chen, Rongsheng HKUST affiliated (currently or previously) ; Wong, Man View this author's profile ; Kwok, Hoi Sing View this author's profile
Source: Chinese Journal of Liquid Crystals and Displays, v. 30, (2), April 2015, p. 187-193
Article, 2015