Please use this identifier to cite or link to this item: http://hdl.handle.net/1783.1/1064

Emission of an edge dislocation from a thin-film-covered crack

Authors Qian, CF
Zhang, TY
Tong, P
Issue Date 1998
Source Key engineering materials, v. 145-149, (Part 1&2), 1998, p. 161-166
Summary The emission of an edge dislocation from a thin-film-covered crack is studied in order to investigate the effects of a passive film on stress-corrosion cracking. The results show that the crack stress field in the film due to the applied loads is enhanced by a harder film or abated by a softer film. For an edge dislocation in the film, both the slip component of the image force and the shielding effect are stronger when the film is harder. Under pure mode II or III loadings a harder thin film makes the dislocation emission easier and a softer film makes the dislocation emission more difficult if the film thickness is smaller than a critical value. The opposite is also true if the film thickness is larger than the critical value. Under pure mode I loadings, however, a harder thin film makes the dislocation emission more difficult and a softer film makes the dislocation emission easier for the two film thicknesses used in this study.
Note The work is supported by the Hong Kong Research Grants Council under RGC Grant, HKUST 819/96E.
Subjects
ISSN 1013-9826
Language English
Format Article
Access View full-text via Web of Science
View full-text via Scopus
Find@HKUST
Files in this item:
File Description Size Format
keyeng01.pdf 713.01 kB Adobe PDF