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Experimental results and simulation of substrate noise coupling via planar spiral inductor in RF ICs

Authors Pun, Alan
Yeung, Tony
Lau, Jack HKUST affiliated (currently or previously)
Clement, François J R
Su, David
Issue Date 1997
Source Technical digest - International Electron Devices Meeting , 1997, p. 325-328
Summary While previous studies [3] on substrate coupling focused mostly on noise induced through drain-bulk capacitance, substrate coupling from planar spiral inductors at radio frequency via the oxide capacitance have not been reported. This paper presents experimental data and simulation results for inductor-induced noise in the substrate. Noise coupling from conventional and hollow inductors via the substrate to P+ diffusions with and without guard rings were also examined. A compact model of the inductor and substrate that can accurately match the measured inductor-induced noise is then derived. Using the inductor-substrate model, we investigated the effectiveness of various guard rings configurations to reducing substrate noise coupling, the trade-off between noise coupling and self-inductance, and the coupling of noise from the inductor of a tuned RF amplifier.
Note 1997 International Electron Devices Meeting, Washington, DC, USA, 7 December 1997 through 10 December 1997, Code 48095
ISSN 0163-1918
ISBN 0780341015
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Language English
Format Conference paper
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