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Surface-plasmon-enhanced photoluminescence from metal-capped Alq(3) thin Films

Authors Tam, Man Chun HKUST affiliated (currently or previously)
Su, Huimin HKUST affiliated (currently or previously)
Wong, Kam Sing View this author's profile
Zhu, Xiuling HKUST affiliated (currently or previously)
Kwok, Hoi Sing View this author's profile
Issue Date 2009
Source Applied physics letters , v. 95, (5), 2009, AUG 3, article number 051503
Summary Absolute quantum efficiencies of surface-plasmon-enhanced photoluminescence from Au capped Alq(3) films were measured using an integrating sphere. The metal "mirror" and directional enhancement effects due to surface roughness which usually occur in forward/backward collection measurements were eliminated using this integrating sphere technique. Up to 40\% of the enhanced photoluminescence observed using the forward/backward collection method was shown to have come from mirror and/or enhanced directional scattering effects. Purcell factors obtained from the integrating sphere data and from time-resolved photoluminescence measurements were consistent, confirming surface-plasmon coupling. Incorporating a thin spacer layer enhanced the quantum efficiency and also eliminated nonradiative recombination due to the metal layer. The results clearly show the importance of using an integrating sphere when measuring overall surface-plasmon quantum efficiencies to eliminate directional scattering effects.
ISSN 0003-6951
Rights Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at
Language English
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