Please use this identifier to cite or link to this item: http://hdl.handle.net/1783.1/72962

Investigating the chain conformations of spin-coated polymer thin films by ToF-SIMS depth profiling

Authors Ren, Xianwen HKUST affiliated (currently or previously)
Weng, Lutao HKUST affiliated (currently or previously)
Fu, Yi HKUST affiliated (currently or previously).
Ng, Kai Mo HKUST affiliated (currently or previously)
Chan, Chi Ming View this author's profile
Issue Date 2015
Source Surface and Interface Analysis , v. 47, (10), October 2015, p. 953-960
Summary Thin films of bromine-terminated poly(bisphenol A octane ether) (BA-C10) were prepared using 1,2-dichlorobenzene (ODCB) as the solvent. The organization of the chains in these amorphous polymer films was evaluated using time-of-flight secondary ion mass spectrometry (ToF-SIMS) depth profiling. For the thin films, the bifunctional polymer chains were folded and anchored to the substrate via their two Br end groups and a polymer brush of chain loops was formed on the substrate. As the film thickness increased, polymer chains in a random coil conformation were found to reside on the top of the polymer brush. Depth profiling revealed that the polymer chains were densely packed at the interface. Moreover, the polymer films showed thermal stability, implying strong interactions between the end groups and the substrate.
Subjects
ISSN 0142-2421
Language English
Format Article
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