Please use this identifier to cite or link to this item: http://hdl.handle.net/1783.1/80306

Surface Characterization of Polymer Blends by XPS and ToF-SIMS

Authors Chan, Chi Ming View this author's profile
Weng, Lu-Tao HKUST affiliated (currently or previously)
Issue Date 2016
Source Materials , v. 9, (8), August 2016, article number 655
Summary The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends.
Subjects
XPS
ISSN 1996-1944
Language English
Format Article
Access View full-text via DOI
View full-text via Web of Science
View full-text via Scopus
Find@HKUST